Title :
Red-eyes removal through cluster based Linear Discriminant Analysis
Author :
Battiato, S. ; Farinella, G.M. ; Guarnera, M. ; Messina, G. ; Ravì, D.
Author_Institution :
Dipt. di Mat. e Inf., Univ. degli Studi di Catania, Catania, Italy
Abstract :
Red-eye artifact is a well-known problem in digital photography. Since the large diffusion of mobile devices with embedded camera and flashgun, automatic detection and correction of red-eyes have become an important task. In this paper we describe a technique that makes use of three steps to identify and correct red-eyes. First, red-eye candidates are extracted from the input image by using simple color segmentation coupled with geometrical constraints. A set of linear discriminant classifiers is then learned on the clustered patches space, and hence employed to distinguish between eyes and non-eyes patches. The proposed cluster-based Linear Discriminant Analysis is used to deal with the multi-modally nature of the input space. The third step of the pipeline is devoted to artifacts correction through de-saturation and brightness reduction. Experimental results on a large dataset of images demonstrate the effectiveness of the pro- posed pipeline that outperforms other existing solutions in terms of hit rates maximization, false positives reduction and ad-hoc quality measure.
Keywords :
cameras; digital photography; image classification; image colour analysis; image segmentation; pattern clustering; ad-hoc quality measure; automatic artifact correction; automatic detection; brightness reduction; cluster based linear discriminant analysis; clustered patches space; color segmentation; digital photography; embedded camera; flashgun; geometrical constraint; mobile devices; red eye artifact; red eye candidates; Ash; Brightness; Image color analysis; Linear discriminant analysis; Pipelines; Pixel; Shape; Linear Discriminant Analysis; Multi-modally Distributed Classes; Red-eyes Detection; Red-eyes Removal;
Conference_Titel :
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-7992-4
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2010.5649987