Title :
Evolution of Inline Network Encryptors toward the High Assurance Internet Protocol Interoperability Specifications (HAIPIS)
Author :
Widby, J.B. ; Rio, R.D.D. ; Fulton, D.O. ; Dunn, Col C.
Author_Institution :
US Army Battle Command Battle Lab., Fort Gordon, GA, USA
Abstract :
The National Security Agency (NSA) has established new High Assurance Internet Protocol Interoperability Specifications (HAIPIS) that requires different vendor´s Inline Network Encryption (INE) devices to be interoperable at a higher level of intelligence. The end result will force the standardization of different encryption algorithms produced by different vendors. The US Army Battle Command Battle Laboratory - Gordon (BCBL(G)) has been entrusted with the responsibility of ensuring that new INEs meet HAIPIS as well as function within the Army´s doctrinal concepts and deployment strategies. The BCBL(G) is one of the Army´s premier facilities for operational assessments and operational experimentation for new INE devices. The BCBL(G) applies a unique blend of engineers, scientists and analysts to demonstrate, validate and verify INE hardware and software functions. The BCBL(G) provides the ability to rapidly evaluate vendor proposed telecommunication technologies that must be immediately leveraged to the Warfighter in order to maintain information security and tactical information superiority. The history of Army INE development is rich with lessons to be learned. The future of Army INE development is full of new challenges. This paper documents some of the lessons learned and outlines new challenges.
Keywords :
Internet; cryptography; military communication; military computing; transport protocols; High Assurance Internet Protocol Interoperability Specifications; Inline Network Encryption devices; information security; military communication; Cryptography; Hardware; IP networks; Information security; Intelligent networks; Laboratories; Maintenance engineering; National security; Protocols; Standardization;
Conference_Titel :
Information Assurance Workshop, 2004. Proceedings from the Fifth Annual IEEE SMC
Print_ISBN :
0-7803-8572-1
DOI :
10.1109/IAW.2004.1437813