• DocumentCode
    3308343
  • Title

    A novel contour error estimation in biaxial contouring control

  • Author

    Yang, Jiangzhao ; Li, Zexiang

  • Author_Institution
    Div. of Control & Mechatron., Harbin Inst. of Technol., Shenzhen, China
  • fYear
    2009
  • fDate
    15-18 Dec. 2009
  • Firstpage
    7545
  • Lastpage
    7550
  • Abstract
    The objective of the multi-axis coordinated control system is to minimize the contour error which is the minimal distance from the actual position to the desired trajectory. Contour error estimation is of importance during the contouring control. Conventional researches adopt a way that approximating the contour error by the distance from the actual position to the tangent line or plane at the desired position. However, it suffers from the case of overcutting and undercutting. In this paper, a novel contour error estimation approach, based on the geometric properties of the desired trajectory, is proposed. In this case, the contour error is evaluated in the way that taking the difference between the current radius and the radius of the curvature at the desired position. It is found that the proposed approach gives a better result in the evaluation of contour error when tracking trajectories with both constant curvature and nonconstant curvature. Moreover, the proposed approach gives a better tracking result when the cross-coupled control, based on the stable close loops of individual servo axis, is designed to achieve the contouring control.
  • Keywords
    estimation theory; position control; biaxial contouring control; contour error estimation; cross-coupled control; multiaxis coordinated control system; trajectory control; Computer errors; Control systems; Electrical equipment industry; Error analysis; Error correction; Industrial control; Servomechanisms; Tellurium; Tracking loops; Trajectory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 2009 held jointly with the 2009 28th Chinese Control Conference. CDC/CCC 2009. Proceedings of the 48th IEEE Conference on
  • Conference_Location
    Shanghai
  • ISSN
    0191-2216
  • Print_ISBN
    978-1-4244-3871-6
  • Electronic_ISBN
    0191-2216
  • Type

    conf

  • DOI
    10.1109/CDC.2009.5400346
  • Filename
    5400346