Title :
BSTO/MgO microstrip line 45° phase shifter with wide tuning range and low insertion loss
Author :
Chai, Dongkyu ; Yoon, Giwan
Author_Institution :
Inf. & Commun. Univ., Taejon, South Korea
Abstract :
The design of a 7-coupled microstrip line 45° phase shifter is proposed in this paper. Tunability was achieved by utilizing the characteristic that the relative dielectric constant of ferroelectrics depends on the applied bias voltage. To obtain a large tuning range of the phase shifter, we added many couplings within the allowable loss range. In terms of control voltage, we applied 0 V and 150 V respectively to inspect the variance of phase shift. At 16 GHz and 0 V, DPS (differential phase shift) is 45°. But at the same frequency and 150 V, DPS is 126°. Thus, the tuning range of the phase shifter reaches 81°. Our frequency band of interest is from 15 GHz to 16.8 GHz. As a result of simulations, RL (return loss) is larger than 19 dB and IL (insertion loss) is less than 2.7 dB with both 0 V and 150 V in this frequency range. The size of the tunable phase shifter is 7.4 mm × 2.2 mm × 0.5 mm.
Keywords :
barium compounds; circuit tuning; coupled circuits; ferroelectric materials; losses; magnesium compounds; microstrip lines; microwave phase shifters; permittivity; strontium compounds; titanium compounds; 0 V; 0.5 mm; 15 to 16.8 GHz; 150 V; 16 GHz; 19 dB; 2.2 mm; 2.7 dB; 7.4 mm; BSTO/MgO composites; BSTO/MgO coupled microstrip line phase shifter; BaSrTiO3-MgO; applied bias control voltage; circuit tunability; coupling losses; differential phase shift variance; ferroelectric material relative dielectric constant; insertion loss; microstrip line couplings; operating frequency band/range; phase shifter size; phase shifter tuning range; return loss; Coupling circuits; Dielectric constant; Equations; Ferroelectric materials; Frequency; Insertion loss; Microstrip; Phase shifters; Transmission line theory; Voltage;
Conference_Titel :
Microwave and Millimeter Wave Technology, 2002. Proceedings. ICMMT 2002. 2002 3rd International Conference on
Print_ISBN :
0-7803-7486-X
DOI :
10.1109/ICMMT.2002.1187901