DocumentCode :
3308424
Title :
Growth of semi-insulating InP:Fe in a low pressure hydride VPE system using elemental iron and ferrocene as dopant sources
Author :
Beccard, R. ; Beuven, S. ; Heime, K. ; Harde, P. ; Schmald, R.
Author_Institution :
Inst. fuer Halbleitertechnik, RWTH Aachen, Germany
fYear :
1992
fDate :
21-24 April 1992
Firstpage :
117
Lastpage :
120
Abstract :
The authors have demonstrated the suitability of the low-pressure hydride VPE (vapor-phase epitaxy) process for the growth of semi-insulating InP:Fe using two different iron sources. The elemental iron source that is commonly used in hydride VPE systems offers the advantage of a simple and cost-efficient setup due to its similarity to the indium source. It allows the incorporation of iron at very high concentrations, above 10/sup 19/ cm/sup -3/. To achieve a uniform vertical iron distribution of the incorporated iron, special care must be taken when performing the growth. The organic ferrocene source also allows the iron doping of InP at doping levels up to 10/sup 18/ cm/sup -3/. In contrast to the elemental iron source a kinetically limited Fe incorporation is found. A high vertical uniformity of the Fe incorporation can be obtained easily. By using both iron sources, high specific resistivities in the 10/sup 8/-10/sup 9/- Omega -cm region can be achieved.<>
Keywords :
III-V semiconductors; indium compounds; iron; semiconductor doping; semiconductor growth; vapour phase epitaxial growth; 10/sup 8/ to 10/sup 9/ ohmcm; InP:Fe; dopant sources; doping levels; elemental Fe source; ferrocene; growth; high specific resistivities; kinetically limited Fe incorporation; low pressure hydride VPE system; semi-insulating InP:Fe; uniform vertical Fe distribution; vapor-phase epitaxy; Buffer layers; Epitaxial growth; Equations; Human computer interaction; Hydrogen; Indium phosphide; Inductors; Insulation; Iron; Optical device fabrication;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1992., Fourth International Conference on
Conference_Location :
Newport, RI, USA
Print_ISBN :
0-7803-0522-1
Type :
conf
DOI :
10.1109/ICIPRM.1992.235663
Filename :
235663
Link To Document :
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