• DocumentCode
    330845
  • Title

    A parametric study of the design constraints and manufacturing tolerances for controlled impedance tape ball grid array designs

  • Author

    Harvey, P.M.

  • Author_Institution
    3M Electron. Products Div., Austin, TX, USA
  • fYear
    1998
  • fDate
    19-21 Oct 1998
  • Firstpage
    217
  • Lastpage
    224
  • Abstract
    This paper investigates the design constraints and manufacturing tolerances necessary to achieve the performance objectives in tape ball grid array (TBGA) packaging necessary for integrated circuit (IC) devices requiring controlled impedance interconnections to the device output drivers. The emphasis of the paper is on correlation of electrical performance parameters that are critical to the operation of the TBGA package with the manufacturing tolerances and related process control strategies on physical product characteristics of the TBGA package. This is done by parametric analysis of the electrical parameters using electromagnetic extraction tools and then correlation of these parameters to manufacturing process control scenarios by statistical analysis and Monte Carlo process simulation. The study indicates strong interdependence between electrical performance and manufacturing tolerances and process control
  • Keywords
    Monte Carlo methods; ball grid arrays; electric impedance; integrated circuit design; integrated circuit interconnections; integrated circuit packaging; process control; statistical analysis; Monte Carlo process simulation; TBGA package; TBGA packaging; controlled impedance interconnections; controlled impedance tape ball grid array designs; design constraints; device output drivers; electrical parameters; electrical performance; electrical performance parameters; electromagnetic extraction tools; integrated circuit devices; manufacturing process control scenarios; manufacturing tolerances; parametric analysis; parametric study; physical product characteristics; process control; process control strategies; statistical analysis; tape ball grid array packaging; Driver circuits; Electronics packaging; Impedance; Integrated circuit interconnections; Integrated circuit manufacture; Integrated circuit packaging; Manufacturing processes; Parametric study; Process control; Pulp manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1998. Twenty-Third IEEE/CPMT
  • Conference_Location
    Austin, TX
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-4523-1
  • Type

    conf

  • DOI
    10.1109/IEMT.1998.731078
  • Filename
    731078