DocumentCode :
330845
Title :
A parametric study of the design constraints and manufacturing tolerances for controlled impedance tape ball grid array designs
Author :
Harvey, P.M.
Author_Institution :
3M Electron. Products Div., Austin, TX, USA
fYear :
1998
fDate :
19-21 Oct 1998
Firstpage :
217
Lastpage :
224
Abstract :
This paper investigates the design constraints and manufacturing tolerances necessary to achieve the performance objectives in tape ball grid array (TBGA) packaging necessary for integrated circuit (IC) devices requiring controlled impedance interconnections to the device output drivers. The emphasis of the paper is on correlation of electrical performance parameters that are critical to the operation of the TBGA package with the manufacturing tolerances and related process control strategies on physical product characteristics of the TBGA package. This is done by parametric analysis of the electrical parameters using electromagnetic extraction tools and then correlation of these parameters to manufacturing process control scenarios by statistical analysis and Monte Carlo process simulation. The study indicates strong interdependence between electrical performance and manufacturing tolerances and process control
Keywords :
Monte Carlo methods; ball grid arrays; electric impedance; integrated circuit design; integrated circuit interconnections; integrated circuit packaging; process control; statistical analysis; Monte Carlo process simulation; TBGA package; TBGA packaging; controlled impedance interconnections; controlled impedance tape ball grid array designs; design constraints; device output drivers; electrical parameters; electrical performance; electrical performance parameters; electromagnetic extraction tools; integrated circuit devices; manufacturing process control scenarios; manufacturing tolerances; parametric analysis; parametric study; physical product characteristics; process control; process control strategies; statistical analysis; tape ball grid array packaging; Driver circuits; Electronics packaging; Impedance; Integrated circuit interconnections; Integrated circuit manufacture; Integrated circuit packaging; Manufacturing processes; Parametric study; Process control; Pulp manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1998. Twenty-Third IEEE/CPMT
Conference_Location :
Austin, TX
ISSN :
1089-8190
Print_ISBN :
0-7803-4523-1
Type :
conf
DOI :
10.1109/IEMT.1998.731078
Filename :
731078
Link To Document :
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