DocumentCode
3308490
Title
A new approach for the nonlinearity test of ADCs/DACs and its application for BIST
Author
Xu, Fang
Author_Institution
Inst. fur Theor. Elektrotech., Hannover Univ., Germany
fYear
1999
fDate
25-28 May 1999
Firstpage
34
Lastpage
38
Abstract
This paper describes an algorithm to derive the nonlinearity performances of Analog-to-Digital and Digital-to-Analog Converters (ADCs/DACs) from FFT results. The main advantages of the new approach over conventional ones are that the test stimuli are simpler and the influence of noise on test results decreases. This method is especially useful for the BIST of converters. Experiments have shown the feasibility of this approach.
Keywords
analogue-digital conversion; built-in self test; digital-analogue conversion; fast Fourier transforms; frequency-domain analysis; harmonic distortion; ADC; BIST; DAC; FFT results; decreased noise influence; frequency domain test; harmonic distortion; mixed signal tester; nonlinearity performance; nonlinearity test algorithm; sine wave stimuli; Analog-digital conversion; Built-in self-test; Digital signal processing; Frequency domain analysis; Linearity; Performance evaluation; Signal generators; Signal resolution; Signal sampling; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
European Test Workshop 1999. Proceedings
Conference_Location
Constance, Germany
Print_ISBN
0-7695-0390-X
Type
conf
DOI
10.1109/ETW.1999.804206
Filename
804206
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