DocumentCode :
3308628
Title :
Developing an efficient cross validation strategy to determine classifier performance (CVCP)
Author :
van der Merwe, N.T. ; Hoffman, A.J.
Author_Institution :
Sch. for Electr. & Electron. Eng., Potchefstroom Univ. for CHE, South Africa
Volume :
3
fYear :
2001
fDate :
2001
Firstpage :
1663
Abstract :
We develop an efficient cross validation strategy to determine classifier performance (CVCP). Previous techniques for LOO CV (leave one out cross validation) required the evaluation of up to M models, with M the sample size, making it prohibitively expensive for many practical applications. We present a technique, namely CVCP, requiring only O(Mlog2(M)) operations and show that the performance of the classifier can be evaluated accurately with the new technique. To combat overfitting of neural classifiers CV is often used to determine the performance on an independent test set. An extreme form of validation is LOO CV, in which each sample forms an independent test set. In this way very efficient use is made of the data set. Unfortunately this implies that we need to build M models. Due to the slow convergence of neural network architectures, it may not be practical to use LOO CV in many applications. We propose an efficient algorithm, CVCP, to determine CV performance. The resulting error rate compares favourably with the Bayes error rate. CVCP can thus be used to determine classifier performance without the associated computational complexity of LOO CV
Keywords :
computational complexity; convergence; learning (artificial intelligence); neural nets; pattern classification; O(Mlog2(M)) operations; classifier performance; cross validation strategy; error rate; leave one out cross validation; neural classifiers; overfitting; Africa; Channel hot electron injection; Computational complexity; Computer architecture; Convergence; Data mining; Error analysis; Neural networks; Testing; Training data;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Networks, 2001. Proceedings. IJCNN '01. International Joint Conference on
Conference_Location :
Washington, DC
ISSN :
1098-7576
Print_ISBN :
0-7803-7044-9
Type :
conf
DOI :
10.1109/IJCNN.2001.938411
Filename :
938411
Link To Document :
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