DocumentCode
3308642
Title
Application of supply current testing to analogue circuits, towards a structural analogue test methodology
Author
Manhaeve, H. ; Verfaillie, J. ; Straka, B. ; Cornil, J.P.
Author_Institution
Dept. of Microelectron., KHBO Oostende, Belgium
fYear
1999
fDate
25-28 May 1999
Firstpage
51
Lastpage
56
Abstract
This paper describes work in progress towards the development, evaluation and validation of a structural, cost effective and quantifiable analog and mixed-signal test methodology, applicable in a production test environment and based on the application of supply current testing. To enable and support the measurements at first an analog supply current monitor was realised. The monitor offers a measurement range of 50 mA, a bandwidth of 1.5 MHz and a resolution better than 1 /spl mu/A. Subsequently the monitor was used to carry out measurements on a mixed-signal Asynchronous Digital Subscriber Line (ADSL) ASIC, to evaluate the feasibility of the methodology. As these initial measurements provided very interesting results, the experiments towards the validation and quantification of the test methodology are now being repeated on a larger scale. The results gathered so far show the potential of the approach to enhance test quality combined with test cost reduction.
Keywords
analogue integrated circuits; automatic test equipment; automatic test software; built-in self test; electric current measurement; mixed analogue-digital integrated circuits; production testing; 1.5 MHz; ATE environment; analog supply current monitor; analogue circuits; mixed-signal ADSL ASIC; mixed-signal test methodology; production test environment; structural analogue test methodology; supply current testing; test cost reduction; test quality; test software; Circuit testing; Current supplies;
fLanguage
English
Publisher
ieee
Conference_Titel
European Test Workshop 1999. Proceedings
Conference_Location
Constance, Germany
Print_ISBN
0-7695-0390-X
Type
conf
DOI
10.1109/ETW.1999.804221
Filename
804221
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