Title :
An integrated circuit for network analysis within 50-200 GHz
Author :
Wohlgemuth, O. ; Agarwal, B. ; Pullela, R. ; Mensa, D. ; Lee, Q. ; Guthrie, J. ; Rodwell, M.J.W. ; Reuter, R. ; Braunstein, J. ; Schlechtweg, M. ; Krems, T. ; Köhler, K.
Author_Institution :
Fraunhofer-Inst. for Appl. Solid State Phys., Freiburg, Germany
Abstract :
This paper presents an integrated circuit, based on nonlinear transmission lines (NLTL), for a vector network analyzer system (VNA) within 50-200 GHz. It is the first integrated circuit containing all elements of an S-parameter test set: a multiplier to generate the RF signal, directional couplers to separate the incident and reflected waves, and a pair of high speed sampling circuits to convert the signals down to lower frequencies,
Keywords :
MIMIC; S-parameters; analogue integrated circuits; directional couplers; millimetre wave measurement; network analysers; 50 to 200 GHz; S-parameter test set; directional couplers; high speed sampling circuits; mm-wave ICs; multiplier; nonlinear transmission lines; vector network analyzer system; Circuit analysis; Circuit testing; Directional couplers; Distributed parameter circuits; High speed integrated circuits; Integrated circuit testing; Radiofrequency integrated circuits; Sampling methods; Scattering parameters; Signal generators;
Conference_Titel :
Terahertz Electronics Proceedings, 1998. THz Ninety Eight. 1998 IEEE Sixth International Conference on
Conference_Location :
Leeds
Print_ISBN :
0-7803-4903-2
DOI :
10.1109/THZ.1998.731678
