Title :
Complex permittivity measurements using a quasi-optical multistate reflectometer
Author :
Thompson, D. ; Miles, R.E. ; Pollard, R.D.
Author_Institution :
Inst. of Microwaves & Photonics, Leeds Univ., UK
Abstract :
The complex permittivity of a well established high frequency dielectric has been measured using a quasi-optical multistate reflectometer. The permittivity is determined using two separate methods; one employing waveguide and the other a free-space measurement. The reflectometer is calibrated separately for each technique using free-space and waveguide standards. An analysis of the uncertainties involved in the measurement is given and initial results are presented
Keywords :
calibration; measurement uncertainty; microwave reflectometry; permittivity measurement; submillimetre wave measurement; calibration; complex permittivity measurements; free-space measurement; free-space standards; high frequency dielectric; measurement uncertainties; quasi-optical multistate reflectometer; waveguide standards; Calibration; Circuits; Dielectric materials; Dielectric measurements; Equations; Optical materials; Optical waveguides; Permittivity measurement; Power measurement; Reflection;
Conference_Titel :
Terahertz Electronics Proceedings, 1998. THz Ninety Eight. 1998 IEEE Sixth International Conference on
Conference_Location :
Leeds
Print_ISBN :
0-7803-4903-2
DOI :
10.1109/THZ.1998.731693
