Title :
A calibrated tuner for millimeter device evaluation
Author :
Rothman, Michael A.
Author_Institution :
Nat. Radio Astron. Obs., Charlottesville, VA, USA
Abstract :
A description is given of a tuner which is a mechanically tuned, calibrated two-port impedance transformer which operates over the 33-50 GHz (WR22) waveguide band. With the input waveguide port terminated in a matched load, almost any desired impedance can be obtained at the output, open-microstrip port. This variation is obtained by setting two mechanical waveguide shorts to positions specified by a computer program. The author summarizes the analysis of the tuner and touches on an application of the tuner for determining the noise parameters of a chip (high-electromobility) transistor. This tuner is believed to provide the most accurate measurement of minimum noise temperature of a chip transistor at 43 GHz currently available, and is possibly the only component available for determining all four noise parameters
Keywords :
calibration; electric noise measurement; electron device noise; high electron mobility transistors; microwave measurement; solid-state microwave devices; tuning; 33 to 50 GHz; EHF; HEMT; calibrated tuner; calibrated two-port impedance transformer; computer program; input waveguide port; matched load; mechanical waveguide shorts; mechanically tuned; millimeter device evaluation; minimum noise temperature; noise parameters; waveguide band; Admittance; Impedance; Manufacturing; Microstrip; Millimeter wave devices; Planar waveguides; Probes; Tuners; Waveguide theory; Waveguide transitions;
Conference_Titel :
Southeastcon '89. Proceedings. Energy and Information Technologies in the Southeast., IEEE
Conference_Location :
Columbia, SC
DOI :
10.1109/SECON.1989.132350
