• DocumentCode
    3309031
  • Title

    Complex Airy analysis of photoreflectance spectra for bulk In/sub x/Ga/sub 1-x/As on InP and In/sub x/Ga/sub 1-x/As HEMTs

  • Author

    Estrera, J.P. ; Duncan, W.M. ; Kao, Y.C. ; Liu, H.Y.

  • Author_Institution
    Univ. of Texas at Dallas, Richardson, TX, USA
  • fYear
    1992
  • fDate
    21-24 April 1992
  • Firstpage
    28
  • Lastpage
    31
  • Abstract
    The authors present a detailed, first-principle analysis of photoreflectance (PR) spectra using complex Airy functions and their derivatives. With the use of the complex Airy functions, PR spectra directly yield band-gap energies (light and heavy hole). The proposed model considers three distinct but superimposed features in the PR spectra of InGaAs which represent the light and heavy hole bands and an exciton feature below the band-gap energy. The band-gap features are modeled using complex Airy functions and their derivatives and the dielectric function of the material. The complex Airy lineshapes are evaluated numerically and fit to the PR spectra using a sequential simplex procedure on a personal computer. The complex Airy lineshapes are applied to both intermediate electric field (Franz-Keldysh oscillations) and low field PR spectra, illustrating that complex Airy functional analysis represents a generalized treatment. The authors correlate energy from the PR spectral fits to those determined from photoluminescence measurements.<>
  • Keywords
    III-V semiconductors; energy gap; gallium arsenide; high electron mobility transistors; indium compounds; photoreflectance; Franz-Keldysh oscillations; HEMTs; InGaAs-InP; band-gap energies; complex Airy functions; dielectric function; exciton; heavy hole; intermediate electric field; light hole; low field; photoreflectance spectra; semiconductor; Dielectrics; Excitons; HEMTs; Indium gallium arsenide; Indium phosphide; MODFETs; Photonic band gap; Physics; Solid modeling; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1992., Fourth International Conference on
  • Conference_Location
    Newport, RI, USA
  • Print_ISBN
    0-7803-0522-1
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1992.235703
  • Filename
    235703