DocumentCode
3309191
Title
Leakage Current Reduction in 6T Single Cell SRAM at 90nm Technology
Author
Birla, Shilpi ; Shukla, Neeraj Kr ; Mukherjee, Debasis ; Singh, R.K.
Author_Institution
E&CE Deptt, SPSU, Udaipur, India
fYear
2010
fDate
20-21 June 2010
Firstpage
292
Lastpage
294
Abstract
The emerging Wireless Sensor Network technologies are facilitating novel applications in health monitoring, industrial monitoring and security surveillance. The small physical dimensions of wireless sensor nodes often restrict the energy source to a small battery. The limited energy consumption requirement demands for ultra-low power sensing, processing and communication. This paper targets the modeling and simulation of CMOS leakage currents and its minimization approach to reduce the power consumption by a single cell SRAM cache. The popular approaches for leakage reduction are the data retention gated ground, and dynamic threshold voltage for cache. The work focuses on the simulation of a SRAM Cell for the data retention gated ground and drowsy mode SRAM Cell which shows that the current reduction of around 25% in s simulation model, respectively in comparison with the conventional cell with no current reduction technique.
Keywords
Batteries; Communication system security; Energy consumption; Leakage current; Monitoring; Random access memory; Semiconductor device modeling; Surveillance; Threshold voltage; Wireless sensor networks; Deep Sub-micron; Leakage Current; Sub-Threshold Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Advances in Computer Engineering (ACE), 2010 International Conference on
Conference_Location
Bangalore, Karnataka, India
Print_ISBN
978-1-4244-7154-6
Type
conf
DOI
10.1109/ACE.2010.42
Filename
5532822
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