• DocumentCode
    3309191
  • Title

    Leakage Current Reduction in 6T Single Cell SRAM at 90nm Technology

  • Author

    Birla, Shilpi ; Shukla, Neeraj Kr ; Mukherjee, Debasis ; Singh, R.K.

  • Author_Institution
    E&CE Deptt, SPSU, Udaipur, India
  • fYear
    2010
  • fDate
    20-21 June 2010
  • Firstpage
    292
  • Lastpage
    294
  • Abstract
    The emerging Wireless Sensor Network technologies are facilitating novel applications in health monitoring, industrial monitoring and security surveillance. The small physical dimensions of wireless sensor nodes often restrict the energy source to a small battery. The limited energy consumption requirement demands for ultra-low power sensing, processing and communication. This paper targets the modeling and simulation of CMOS leakage currents and its minimization approach to reduce the power consumption by a single cell SRAM cache. The popular approaches for leakage reduction are the data retention gated ground, and dynamic threshold voltage for cache. The work focuses on the simulation of a SRAM Cell for the data retention gated ground and drowsy mode SRAM Cell which shows that the current reduction of around 25% in s simulation model, respectively in comparison with the conventional cell with no current reduction technique.
  • Keywords
    Batteries; Communication system security; Energy consumption; Leakage current; Monitoring; Random access memory; Semiconductor device modeling; Surveillance; Threshold voltage; Wireless sensor networks; Deep Sub-micron; Leakage Current; Sub-Threshold Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advances in Computer Engineering (ACE), 2010 International Conference on
  • Conference_Location
    Bangalore, Karnataka, India
  • Print_ISBN
    978-1-4244-7154-6
  • Type

    conf

  • DOI
    10.1109/ACE.2010.42
  • Filename
    5532822