Title :
A set-based framework for coherent model invalidation and parameter estimation of discrete time nonlinear systems
Author :
Borchers, S. ; Rumschinski, P. ; Bosio, S. ; Weismantel, R. ; Findeisen, R.
Author_Institution :
Inst. for Autom. Eng., Otto-von-Guericke-Univ., Magdeburg, Germany
Abstract :
This work introduces a unified framework for model invalidation and parameter estimation for nonlinear systems. We consider a model given by implicit nonlinear difference equations that are polynomial in the variables. Experimental data is assumed to be available as possibly sparse, uncertain, but (set-)bounded measurements. The derived approach is based on the reformulation of the invalidation and parameter/state estimation tasks into a set-based feasibility problem. Exploiting the polynomial structure of the considered model class, the resulting non-convex feasibility problem is relaxed into a convex semi-definite one, for which infeasibility can be efficiently checked. The parameter/state estimation task is then reformulated as an outer-bounding problem. In comparison to other methods, we check for feasibility of whole parameter/state regions. The practicability of the proposed approach is demonstrated with two simple biological example systems.
Keywords :
discrete time systems; nonlinear differential equations; nonlinear systems; parameter estimation; polynomials; state estimation; coherent model invalidation; discrete time nonlinear systems; implicit nonlinear difference equations; nonconvex feasibility problem; outer bounding problem; parameter estimation; polynomial structure; set based feasibility problem; set based framework; state estimation; unified framework; Biological system modeling; Difference equations; Electrical engineering; Mathematical model; Measurement uncertainty; Nonlinear systems; Parameter estimation; Polynomials; State estimation; Time measurement;
Conference_Titel :
Decision and Control, 2009 held jointly with the 2009 28th Chinese Control Conference. CDC/CCC 2009. Proceedings of the 48th IEEE Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-3871-6
Electronic_ISBN :
0191-2216
DOI :
10.1109/CDC.2009.5400403