Title :
Measurement and identification of EMI sources using pattern recognition and coding
Author :
Parrish, E.A., Jr. ; McDonald, W.E., Jr.
Author_Institution :
Vanderbilt Univ., Nashville, TN, USA
Abstract :
The authors present a methodology for measuring and identifying EMI (electromagnetic interference) sources in complex electromagnetic environments, such as exist within digital computer systems. In particular, a MAP (maximum a posteriori probability) classifier with list decoding was applied to situations involving very low signal/noise ratios, commonly found in such a problem regime. Coding was applied to the test vectors to improve performance of the system. It was shown that very low error rates are possible with very noisy signals
Keywords :
computer testing; computerised instrumentation; computerised pattern recognition; digital computers; electromagnetic interference; encoding; EMI sources identification; EMI sources measurement; SNR; coding; digital computer systems; electromagnetic interference; error rates; list decoding; maximum a posteriori probability; noisy signals; pattern recognition; signal/noise ratios; test vectors; Channel capacity; Electromagnetic devices; Electromagnetic interference; Electromagnetic measurements; Error analysis; Gaussian noise; Pattern recognition; Signal to noise ratio; System testing; Timing;
Conference_Titel :
Southeastcon '89. Proceedings. Energy and Information Technologies in the Southeast., IEEE
Conference_Location :
Columbia, SC
DOI :
10.1109/SECON.1989.132353