DocumentCode :
3309522
Title :
Nonlinear dynamic behavior of thin PCB board for solder joint reliability study under shock loading
Author :
Keat, Loh Wei ; Hsiang, Lee Yung ; Ajay Munigayah ; We, Tay Tiong
Author_Institution :
Intel Technol., Penang, Malaysia
fYear :
2005
fDate :
11-14 Dec. 2005
Firstpage :
268
Lastpage :
274
Abstract :
Solder joint reliability under shock loading condition has been a concern over the years especially with constant reductions in the characteristic dimensions of the package and the solder joint. With the impeding transition to lead free solder, attention has moved from temperature cycle failure to mechanical shock failure. A method has been developed that employs a specially designed shock test board (STB) to characterize the solder joint performance as a function of board surface strain. This unique test board can be adapted to a wide range of test and boundary conditions. Using this board, a range of shock inputs is tested to establish correlation of the dynamic response and solder joint damage severity. This method can be used to characterize solder joint performance at the component level, early in development. One can also provide board strain based design limits guide system design and prevent late discovery of solder joint issues. Modal analysis based and explicit time integration finite element models have been used to supplement understanding of the board response after shock loading. The shock model demonstrates good correlation of the strain on the thick board while thin board shows challenges in modeling prediction where nonlinear behavior observed. The modeling data also suggested that the maximum principal stress at the solder joint interface is a good failure criterion as it maps well with the actual failure region found.
Keywords :
finite element analysis; modal analysis; nonlinear dynamical systems; printed circuit testing; reliability; solders; PCB board; board surface strain; finite element models; lead free solder; maximum principal stress; mechanical shock failure; modal analysis; nonlinear dynamic behavior; shock loading; shock models; shock test board; solder joint damage; solder joint interface; solder joint reliability; strain gauges; temperature cycle failure; Capacitive sensors; Electric shock; Environmentally friendly manufacturing techniques; Lead; Packaging; Predictive models; Soldering; Surface impedance; Temperature; Testing; Shock test; finite element; solder joint reliability; strain gauges;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Materials and Packaging, 2005. EMAP 2005. International Symposium on
Print_ISBN :
1-4244-0107-0
Type :
conf
DOI :
10.1109/EMAP.2005.1598274
Filename :
1598274
Link To Document :
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