Title :
Estimation of sea ice thickness in the Arctic Sea using polarimetric parameters of C- and X-band space-borne SAR data
Author :
Kim, Jin-Woo ; Kim, Duk-Jin ; Hwang, Byong Jun
Author_Institution :
Sch. of Earth & Environ. Sci., Seoul Nat. Univ., Seoul, South Korea
Abstract :
In this study, we derived the relationship between target depolarization factor and physical parameters of sea ice in order to estimate the thickness using dual-polarization C-and X-band space-borne Synthetic Aperture Radar (SAR) data. The target depolarization factor, the cross-polarized ratio of C-band SAR data, which can explain the target depolarization effect, were strongly related to changes in surface roughness of thick First-Year Ice (FYI) and Multi-Year Ice (MYI), and were almost insensitive to variations in the surface dielectric constant of thick FYI and MYI and the incidence angle of C-band SAR data. This relationship showed a high correlation between target depolarization factor of C-band SAR data, the cross-polarized ratio, and thick FYI and MYI thickness. We validated the estimated method using RADARSAT-2 and TerraSAR-X data and ground-truth data acquired in the Arctic Sea off the northern coast of Greenland.
Keywords :
oceanographic regions; oceanographic techniques; radar polarimetry; remote sensing by radar; sea ice; synthetic aperture radar; Arctic Sea; C-band SAR data cross polarized ratio; C-band spaceborne SAR data; RADARSAT-2; TerraSAR-X; X-band spaceborne SAR data; dual polarization SAR data; first year ice; multiyear ice; polarimetric SAR parameters; sea ice physical parameters; sea ice thickness estimation; surface dielectric constant; surface roughness changes; synthetic aperture radar; target depolarization effect; target depolarization factor; Dielectric constant; Ice thickness; Rough surfaces; Sea ice; Sea surface; Surface roughness; Arctic Sea; Cross-polarized ratio; Depolarization; SAR; Sea ice Thickness;
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-9565-8
Electronic_ISBN :
2153-6996
DOI :
10.1109/IGARSS.2010.5650103