Title :
Fault detection in Reed-Muller canonical (RMC) networks
Author_Institution :
Dept. of Electr. Eng., Kentucky Univ., Lexington, KY
Abstract :
It is shown that there exists a set of test patterns which can detect all single stuck-at and all single-bridging (short circuit) faults in Reed-Muller networks. The number of test patterns is shown to be at most 3n+5, where n is the number of input variables in the function
Keywords :
combinatorial circuits; fault location; logic testing; Reed-Muller canonical networks; combinatorial circuits; fault detection; single bridging faults; single stuck-at; test patterns; Boolean functions; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Input variables; Intelligent networks; Test pattern generators; Upper bound;
Conference_Titel :
Southeastcon '89. Proceedings. Energy and Information Technologies in the Southeast., IEEE
Conference_Location :
Columbia, SC
DOI :
10.1109/SECON.1989.132357
