• DocumentCode
    3310284
  • Title

    Fault detection in Reed-Muller canonical (RMC) networks

  • Author

    Damarla, T.R.

  • Author_Institution
    Dept. of Electr. Eng., Kentucky Univ., Lexington, KY
  • fYear
    1989
  • fDate
    9-12 Apr 1989
  • Firstpage
    192
  • Abstract
    It is shown that there exists a set of test patterns which can detect all single stuck-at and all single-bridging (short circuit) faults in Reed-Muller networks. The number of test patterns is shown to be at most 3n+5, where n is the number of input variables in the function
  • Keywords
    combinatorial circuits; fault location; logic testing; Reed-Muller canonical networks; combinatorial circuits; fault detection; single bridging faults; single stuck-at; test patterns; Boolean functions; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Input variables; Intelligent networks; Test pattern generators; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southeastcon '89. Proceedings. Energy and Information Technologies in the Southeast., IEEE
  • Conference_Location
    Columbia, SC
  • Type

    conf

  • DOI
    10.1109/SECON.1989.132357
  • Filename
    132357
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3310284