Title : 
Selecting neural network architectures via the prediction risk: application to corporate bond rating prediction
         
        
            Author : 
Utans, Joachim ; Moody, John
         
        
            Author_Institution : 
Yale Univ., New Haven, CT, USA
         
        
        
        
        
        
            Abstract : 
The notion of generalization can be defined precisely as the prediction risk, the expected performance of an estimator on new observations. The authors propose the prediction risk as a measure of the generalization ability of multi-layer perceptron networks and use it to select the optimal network architecture. The prediction risk must be estimated from the available data. The authors approximate the prediction risk by v-fold cross-validation and asymptotic estimates of generalized cross-validation or H. Akaike´s (1970) final prediction error. They apply the technique to the problem of predicting corporate bond ratings. This problem is very attractive as a case study, since it is characterized by the limited availability of the data and by the lack of complete a priori information that could be used to impose a structure to the network architecture
         
        
            Keywords : 
feedforward neural nets; financial data processing; forecasting theory; securities trading; asymptotic estimates; case study; corporate bond ratings; expected performance; final prediction error; generalization ability; generalized cross-validation; multi-layer perceptron networks; network architecture; new observations; optimal network architecture; prediction risk; v-fold cross-validation; Availability; Bonding; Computer architecture; Computer science; Multilayer perceptrons; Neural networks; Predictive models; Probability density function; Random variables; Testing;
         
        
        
        
            Conference_Titel : 
Artificial Intelligence Applications on Wall Street, 1991. Proceedings., First International Conference on
         
        
            Conference_Location : 
New York, NY
         
        
            Print_ISBN : 
0-8186-2240-7
         
        
        
            DOI : 
10.1109/AIAWS.1991.236576