• DocumentCode
    3310521
  • Title

    Topographic effects on spaceborne radiometric observations and possible correction strategies

  • Author

    Pulvirenti, Luca ; Pierdicca, Nazzareno ; Marzano, Frank S.

  • Author_Institution
    Dept. Inf., Electron. & Telecommun. Eng., Sapienza Univ. of Rome, Rome, Italy
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    2995
  • Lastpage
    2998
  • Abstract
    A numerical simulator of satellite microwave radiometric observations of mountainous scenes, developed in a previous study, is used to predict the relief effects on the measurements of a spaceborne radiometer. For this purpose, the trends of the error due to topography versus the parameters representing the relief have been analyzed for a test case concerning a mountainous area in the Alps by assuming bare soil and considering L- and C-bands. The results have revealed that the error in satellite microwave radiometric observations is particularly correlated to the mean value of the height and of the slope of the radiometric pixel, as well as to the standard deviation of the aspect angle and of the local incidence angle. A regression analysis has been applied to estimate the error as a function of the parameters representing the relief, using the simulator to build training and test sets.
  • Keywords
    artificial satellites; estimation theory; microwave measurement; radiometry; regression analysis; C-bands; L-bands; aspect angle; bare soil; correction strategy; error estimation; local incidence angle; mountainous scenes; numerical simulator; radiometric pixel; regression analysis; satellite microwave radiometric observations; spaceborne radiometer; spaceborne radiometric observations; standard deviation; topographic effects; topography; Microwave imaging; Microwave measurements; Microwave radiometry; Satellite broadcasting; Satellites; Surface topography; Microwave radiometry; Topography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
  • Conference_Location
    Honolulu, HI
  • ISSN
    2153-6996
  • Print_ISBN
    978-1-4244-9565-8
  • Electronic_ISBN
    2153-6996
  • Type

    conf

  • DOI
    10.1109/IGARSS.2010.5650123
  • Filename
    5650123