Title :
Sampling below the Nyquist rate in interferometric fluorescence microscopy with multi-wavelength measurements to remove aliasing
Author :
Davis, Brynmor J. ; Karl, W. Clem ; Goldberg, Bennett B. ; Swan, Anna K. ; Ünlü, M. Selim
Author_Institution :
Dept. of Electr. & Comput. Eng., Boston Univ., MA, USA
Abstract :
A multi-wavelength 3D fluorescence microscope, with transfer functions varying significantly with wavelength, is proposed. This microscope measures multiple wavelengths concurrently and scans through the object at a rate significantly below the Nyquist criterion, which gives a reduced image acquisition time. The sub-Nyquist sampling produces a set of images contaminated by aliasing. Due to the differing transfer functions, the aliasing effects are different in each image. This allows the aliasing operator to be inverted and a single unaliased image to be constructed. This is an application of the generalized sampling expansion first introduced by Papoulis. The instrument is demonstrated through simulation and shown to produce images of a similar quality to those that would be expected from a Nyquist-rate instrument.
Keywords :
Nyquist criterion; antialiasing; fluorescence; image reconstruction; image sampling; light interferometry; optical microscopy; 3D fluorescence microscope; Nyquist criterion; aliasing operator inversion; aliasing removal; image acquisition time reduction; image quality; interferometric fluorescence microscopy; multichannel sampling; multiple channel image reconstruction; multiwavelength measurements; sub-Nyquist rate sampling; wavelength dependent transfer functions; Current measurement; Electric variables measurement; Fluorescence; Image sampling; Instruments; Microscopy; Pollution measurement; Sampling methods; Time measurement; Wavelength measurement;
Conference_Titel :
Digital Signal Processing Workshop, 2004 and the 3rd IEEE Signal Processing Education Workshop. 2004 IEEE 11th
Print_ISBN :
0-7803-8434-2
DOI :
10.1109/DSPWS.2004.1437969