DocumentCode
3311416
Title
A Nomogram Technique for Microwave Permittivity Determination Using an Open-Ended Coaxial Probe
Author
Ivanov, V.K. ; Silin, O.O. ; Stadn, O.M.
Author_Institution
Inst. for Radiophys. & Electron., Kharkov
Volume
2
fYear
2007
fDate
25-30 June 2007
Firstpage
910
Lastpage
912
Abstract
A nomogram approach is proposed for the determination of the complex permittivity of thin dielectric layers using an open-ended coaxial probe. Nomograms generated for more narrow range of permittivity and having sufficiently dense grid allow direct determination of dielectric constant.
Keywords
dielectric thin films; nomograms; permittivity; permittivity measurement; complex permittivity; dielectric constant; microwave permittivity; nomogram technique; open-ended coaxial probe; thin dielectric layers; Admittance; Apertures; Biological materials; Biological system modeling; Coaxial components; Frequency; Microwave theory and techniques; Millimeter wave radar; Permittivity measurement; Probes;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves and Workshop on Terahertz Technologies, 2007. MSMW '07. The Sixth International Kharkov Symposium on
Conference_Location
Kharkov
Print_ISBN
1-4244-1237-4
Type
conf
DOI
10.1109/MSMW.2007.4294857
Filename
4294857
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