DocumentCode :
3311852
Title :
Wrapped phase based SVM method for 3D object recognition
Author :
Zhang, Hong ; Su, Hongjun
Author_Institution :
Dept. of Comput. Sci., Armstrong Atlantic State Univ., Savannah, GA, USA
fYear :
2009
fDate :
8-11 Aug. 2009
Firstpage :
206
Lastpage :
209
Abstract :
Kernel methods are effective machine learning techniques for many image based pattern recognition problems. Incorporating 3D information is useful in such applications. The optical profilometries and interforometric techniques provide 3D information in an implicit form. Typically phase unwrapping process, which is often hindered by the presence of noises, spots of low intensity modulation, and instability of the solutions, is applied to retrieve the proper depth information. In certain applications such as pattern recognition problems, the goal is to classify the 3D objects in the image, rather than to simply display or reconstruct them. In this paper we present a technique for constructing kernels on the measured data directly without explicit phase unwrapping. Such a kernel will naturally incorporate the 3D depth information and can be used to improve the systems involving 3D object analysis and classification. It avoids possible phase unwrapping errors introduced during object reconstruction.
Keywords :
image classification; image reconstruction; image retrieval; learning (artificial intelligence); object recognition; support vector machines; 3D object recognition; image classification; image reconstruction; information retrieval; intensity modulation; interforometric technique; kernel method; machine learning technique; optical profilometry; pattern recognition; wrapped phase based SVM method; Image reconstruction; Intensity modulation; Kernel; Machine learning; Object recognition; Optical modulation; Optical noise; Pattern recognition; Phase noise; Support vector machines; 3D Object Recongnition; Kernal Construction; Phase Uunwrapping; SVM;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Science and Information Technology, 2009. ICCSIT 2009. 2nd IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-4519-6
Electronic_ISBN :
978-1-4244-4520-2
Type :
conf
DOI :
10.1109/ICCSIT.2009.5234564
Filename :
5234564
Link To Document :
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