Title :
Robust stability of multi-hop control networks
Author :
Weiss, Gera ; Innocenzo, Alessandro D. ; Alur, Rajeev ; Johansson, Karl H. ; Pappas, George J.
Author_Institution :
Univ. of Pennsylvania, Philadelphia, PA, USA
Abstract :
We propose formal models for analyzing robustness of multi-hop control networks, where data from sensors to controllers and from controllers to actuators is sent through a multi-hop communication network subject to disruptions. When communication disruptions are long, compared to the speed of the control system, we propose to model them as permanent link failures. We show that the complexity of analyzing such failures is NP-hard, and discuss a way to overcome this limitation for practical cases using compositional analysis. For typical packet transmission errors (errors with short time span), we propose a transient error model where links fail for one time slot independently of the past and of other links. We provide sufficient conditions for almost sure stability (stability with probability one) in presence of transient link failures, and give efficient decision procedures. The last part of the paper deals with errors that have random time span. We show that, under some conditions, the permanent failure model can be used as a reliable abstraction.
Keywords :
actuators; computational complexity; control system analysis; controllers; fault tolerance; radio networks; robust control; sensors; NP hard; actuators; communication disruptions; compositional analysis; multihop communication network; multihop control networks; packet transmission errors; permanent link failures; robust stability; sensors data; transient error model; transient link failures; Actuators; Communication system control; Control system synthesis; Control systems; Failure analysis; Robust control; Robust stability; Spread spectrum communication; Sufficient conditions; Wireless sensor networks;
Conference_Titel :
Decision and Control, 2009 held jointly with the 2009 28th Chinese Control Conference. CDC/CCC 2009. Proceedings of the 48th IEEE Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-3871-6
Electronic_ISBN :
0191-2216
DOI :
10.1109/CDC.2009.5400552