• DocumentCode
    3312410
  • Title

    Recognition of impurity in ampoules based on wavelet packet decomposition energy distribution and SVM

  • Author

    Jiedi, Sun ; Jiangtao, Wen

  • Author_Institution
    Dept. of Inf. Sci. & Eng., Yanshan Univ., Qinhuangdao, China
  • fYear
    2009
  • fDate
    8-11 Aug. 2009
  • Firstpage
    162
  • Lastpage
    166
  • Abstract
    It presents a feature extraction and recognition method in this paper based on wavelet packet decomposition energy and support vector machine to solve the problem of recognizing the visible impurity in ampoules. The ampoules pictures are taken by the automatic ampoule inspection machine. The zone containing impurity is segmented and called ROI (region of interesting) using the sequence difference and the key point detection. The conventional image processing method can´t meet the requirements of fast processing in the industrial field. It proposes a method based on the information entropy of ROI to extract the useful information and generate a one-dimensional signal. The signal is decomposed by wavelet packet, and then the principal feature vectors are extracted using PCA from the wavelet packet energy components. As the input vectors of support vector machine, the impurity features can be classified rapidly by SMO (sequential minimal optimization). The different types of kernel functions and the corresponding parameters are selected for training and testing in the experiments. The results show that the time-consuming of SVM (support vector machine) is decreased by 60% and the identification accuracy is improved by 35%, compared with the BP network.
  • Keywords
    backpropagation; entropy; feature extraction; image segmentation; image sequences; information retrieval; object detection; object recognition; support vector machines; wavelet transforms; BP network; automatic ampoule inspection machine; feature extraction; impurity recognition; information entropy; information extraction; key point detection; region of interesting; sequence difference; sequential minimal optimization; support vector machine; wavelet packet decomposition energy distribution; Data mining; Feature extraction; Image processing; Image segmentation; Impurities; Information entropy; Inspection; Support vector machine classification; Support vector machines; Wavelet packets; impurity type recognition; information entropy; principal component analysis; support vector machine; wavelet packet decomposition energy distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Information Technology, 2009. ICCSIT 2009. 2nd IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-4519-6
  • Electronic_ISBN
    978-1-4244-4520-2
  • Type

    conf

  • DOI
    10.1109/ICCSIT.2009.5234594
  • Filename
    5234594