Title :
A METHODOLOGY FOR TESTING ARBITRARY BILATERAL BIT-LEVEL SYSTOLIC ARRAYS
Author :
Bandyopadhyay, Supriyo ; Bhattacharya, Bhargab B.
Keywords :
Combinational circuits; Computer science; Controllability; Extremities; Focusing; Image processing; Observability; Signal processing; Systolic arrays; Testing;
Conference_Titel :
Signals, Systems and Computers, 1990 Conference Record Twenty-Fourth Asilomar Conference on
Print_ISBN :
0-8186-2180-X
DOI :
10.1109/ACSSC.1990.523460
