Title :
On fractal yield models: a statistical paradox
Author :
Stapper, C.H. ; Rideout, A.J.
Author_Institution :
Jericho, VT, USA
Abstract :
Although the fractal yield model is very successful in VLSI applications, it also exposes a mathematical inconsistency. Expressing the average number of faults in each sub array, the average number of faults in the complete array, according to this approach, is not statistically correct. This, therefore, is a fractal paradox
Keywords :
Fault tolerance; Fractals; Frequency; Length measurement; Particle measurements; Probability distribution; Semiconductor device measurement; Shape measurement; Testing; Very large scale integration;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1994. Proceedings., The IEEE International Workshop on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-8186-6307-3
DOI :
10.1109/DFTVS.1994.630017
