Title :
Hazard characterization of basic Boolean functions
Author_Institution :
New Orleans Univ., LA, USA
Abstract :
The author presents a method to verify the dynamic behavior of Boolean functions and characterize hazards associated with them. This technique makes it possible to uniformly detect hazards associated with two-level combinational circuits. Specifically, the dynamic behavior of the basic Boolean functions AND, OR, and NOT is considered, and a theorem for the intrinsic AND-function (IAF) hazard is proved. Three corollaries for three different versions of the IAF hazard are given, and a theorem for the intrinsic OR-function (IOF) hazard is proved. Three corollaries for three different versions of the IOF hazard are also given, and the basic Boolean function NOT is shown to be hazard-free. This method lends itself to a rule-based characterization that can be easily automated
Keywords :
Boolean functions; combinatorial circuits; hazards and race conditions; Boolean functions; IAF hazard; IOF hazard; NOT; dynamic behaviour verification; hazard characterization; hazard detection; hazard-free; intrinsic AND-function hazard; intrinsic OR-function hazard; rule-based characterization; theorem; two-level combinational circuits; Boolean functions; Combinational circuits; Delay; Hardware; Hazards; Input variables; Logic design; Multivalued logic; Process design; Very large scale integration;
Conference_Titel :
Southeastcon '89. Proceedings. Energy and Information Technologies in the Southeast., IEEE
Conference_Location :
Columbia, SC
DOI :
10.1109/SECON.1989.132386
