• DocumentCode
    3313379
  • Title

    A multi-segment probabilistic fatigue crack growth model to account for reliability in design of components

  • Author

    Prakash, Raghu V. ; Hariharan, K.

  • Author_Institution
    Dept. of Mech. Eng., Indian Inst. of Technol. Madras, Chennai, India
  • fYear
    2010
  • fDate
    14-16 Dec. 2010
  • Firstpage
    248
  • Lastpage
    255
  • Abstract
    Analysis of fatigue crack growth has undergone several developments in the past few decades. In general, fatigue crack growth is studied using deterministic models from either single or multiple crack growth rate tests. Realizing that several variables influence fatigue crack growth, such as, microstructure, crack length measurement techniques, it is pertinent to assess crack growth using probabilistic models. In the present work, a probabilistic model that considers crack growth data from multiple constant amplitude tests is studied using continuous and segmented crack growth rate data models. It is observed that the prediction of life using Paris constants from continuous data model is accurate only in a finite region of the crack growth. The model based on segmented data provides more accurate life predictions with lesser variance with experimental data than the continuous data model. The proposed modification of probabilistic model for fatigue crack growth can be used to estimate reliability factors based on the scatter in specific crack growth region.
  • Keywords
    design engineering; fatigue cracks; mechanical products; probability; reliability; Paris constants; component design; constant amplitude tests; continuous crack growth; crack length measurement techniques; microstructure; multisegment probabilistic fatigue crack growth model; probabilistic model; reliability; segmented crack growth; crack growth model; multi-segment; probabilistic model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability, Safety and Hazard (ICRESH), 2010 2nd International Conference on
  • Conference_Location
    Mumbai
  • Print_ISBN
    978-1-4244-8344-0
  • Type

    conf

  • DOI
    10.1109/ICRESH.2010.5779556
  • Filename
    5779556