Title :
CMOS self checking circuits with faulty sequential functional blocks
Author :
Metra, Cecilia ; Favalli, Michele ; Riccò, Bruno
Author_Institution :
Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
Abstract :
In this paper, Self Checking Circuits (SCCs) with sequential functional blocks are studied from the point of view of problems possibly arising at the system level because of internal resistive bridging faults (BFs). Electrical level design rules and checking schemes reducing the occurrence probability of such problems are proposed and their effectiveness is verified. Moreover, the sequential functional blocks obtained with the methodology of this paper are Strongly Fault Secure (SFS) with respect to stuck-at faults
Keywords :
CMOS logic circuits; CMOS self checking circuits; electrical level design rules; faulty sequential functional blocks; internal resistive bridging faults; strongly fault secure; stuck-at faults; system level; Automatic testing; Circuit faults; Combinational circuits; Conferences; Electrical fault detection; Error correction codes; Fault detection; Fault tolerant systems; Sequential circuits; Very large scale integration;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1994. Proceedings., The IEEE International Workshop on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-8186-6307-3
DOI :
10.1109/DFTVS.1994.630023
