DocumentCode
3313608
Title
[Front cover]
fYear
2007
fDate
11-13 April 2007
Abstract
The following topics are dealt with: design and diagnostics of electronic circuits; DfT & defect analysis; SOC design & test; fault analysis & circuit reliability; FPGA-based design; memory testing; logic design; fault tolerance; analog & RF design; test quality & test generation; ,model checking & debugging; and analog & MEMS testing.
Keywords
automatic test pattern generation; circuit reliability; fault tolerant computing; formal specification; formal verification; logic design; program debugging; system-on-chip; DfT; FPGA-based design; MEMS testing; RF design; SOC design; analog design; analog testing; circuit reliability; defect analysis; electronic circuits; fault analysis; fault tolerance; logic design; memory testing; model checking; program debugging; test generation; test quality;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Diagnostics of Electronic Circuits and Systems, 2007. DDECS '07. IEEE
Conference_Location
Krakow
Print_ISBN
1-4244-1161-0
Type
conf
DOI
10.1109/DDECS.2007.4295240
Filename
4295240
Link To Document