Title :
Fault tolerant design using error correcting code for multilayer neural networks
Author :
Ito, Hideo ; Yagi, Takeshi
Author_Institution :
Dept. of Inf. & Comput. Sci., Chiba Univ., Japan
Abstract :
A new fault tolerant multilayer neural network (NN) which can correct an error caused by a fault in the output layer neuron is proposed. The principle of the design is that an error correcting code is used for the output space of NN, and NN learns this code in the training phase. Simulation experiments for some examples in relatively small pattern recognition models are examined. As a result, it can be concluded that SEC-DED codes together with some training method are sufficient for the examples, and the proposed design can be adapted effectively to practical applications
Keywords :
fault tolerant computing; SEC-DED codes; double error detection; error correcting code; fault tolerant design; multilayer neural networks; output layer neuron; output space; pattern recognition models; single error correction; training phase; Circuit faults; Error correction; Error correction codes; Fault tolerance; Hardware; Multi-layer neural network; Neural networks; Neurons; Nonhomogeneous media; Pattern recognition;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1994. Proceedings., The IEEE International Workshop on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-8186-6307-3
DOI :
10.1109/DFTVS.1994.630028