DocumentCode
3314296
Title
A general method to design and reconfigure loop-based linear arrays
Author
Shi, Weiping
Author_Institution
Dept. of Comput. Sci., Univ. of North Texas, Denton, TX, USA
fYear
1994
fDate
17-19 Oct 1994
Firstpage
221
Lastpage
229
Abstract
Loop-based defect-tolerant design of linear arrays is easy to manufacture, test and reconfigure. Previous researchers have given ad hoc designs for specific number of neighbors and interconnection patterns. In this paper, we give general results on design and reconfiguration for any number of neighbors and interconnection patterns to achieve best cost/performance
Keywords
reconfigurable architectures; defect-tolerant design; general design method; interconnection patterns; loop-based linear arrays; reconfiguration; Algorithm design and analysis; Computer aided manufacturing; Computer science; Costs; Delay; Design methodology; LAN interconnection; Switches; Testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 1994. Proceedings., The IEEE International Workshop on
Conference_Location
Montreal, Que.
ISSN
1550-5774
Print_ISBN
0-8186-6307-3
Type
conf
DOI
10.1109/DFTVS.1994.630033
Filename
630033
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