DocumentCode :
3314386
Title :
Runtime workload behavior prediction using statistical metric modeling with application to dynamic power management
Author :
Sarikaya, Ruhi ; Isci, Canturk ; Buyuktosunoglu, Alper
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear :
2010
fDate :
2-4 Dec. 2010
Firstpage :
1
Lastpage :
10
Abstract :
Adaptive computing systems rely on accurate predictions of workload behavior to understand and respond to the dynamically-varying application characteristics. In this study, we propose a Statistical Metric Model (SMM) that is system-and metric-independent for predicting workload behavior. SMM is a probability distribution over workload patterns and it attempts to model how frequently a specific behavior occurs. Maximum Likelihood Estimation (MLE) criterion is used to estimate the parameters of the SMM. The model parameters are further refined with a smoothing method to improve prediction robustness. The SMM learns the application patterns during runtime as applications run, and at the same time predicts the upcoming program phases based on what it has learned so far. An extensive and rigorous series of prediction experiments demonstrates the superior performance of the SMM predictor over existing predictors on a wide range of benchmarks. For some of the benchmarks, SMM improves prediction accuracy by 10X and 3X, compared to the existing last-value and table-based prediction approaches respectively. SMM´s improved prediction accuracy results in superior power-performance trade-offs when it is applied to dynamic power management.
Keywords :
maximum likelihood estimation; microprocessor chips; power aware computing; probability; smoothing methods; adaptive computing systems; dynamic power management; last-value prediction; maximum likelihood estimation; microprocessors; parameter estimation; performance management schemes; probability distribution; runtime workload behavior prediction; smoothing method; statistical metric modeling; table-based prediction; Computational modeling; Data models; History; Maximum likelihood estimation; Measurement; Natural languages; Predictive models;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Workload Characterization (IISWC), 2010 IEEE International Symposium on
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-9297-8
Electronic_ISBN :
978-1-4244-9296-1
Type :
conf
DOI :
10.1109/IISWC.2010.5650339
Filename :
5650339
Link To Document :
بازگشت