DocumentCode
3314389
Title
Comparing linear regression and maximum likelihood methods to estimate Weibull distributions on limited data sets: systematic and random errors
Author
Ross, R.
Author_Institution
Transmission & Distribution Power, KEMA, Arnhem, Netherlands
fYear
1999
fDate
1999
Firstpage
170
Abstract
The present paper compares the bias and scatter of the Weibull shape parameter as estimated with the Maximum Likelihood method (ML) and four Linear Regression techniques (LR). For small data sets the bias and scatter can be very significant. It is found that ML and weighted LR give similar results. LR requires to select a plotting position. The effect of the plotting position is shown. Two changes may be used for the revised IEEE guide: plots with expected plotting positions and re-evaluation of ML and LR
Keywords
Weibull distribution; electric breakdown; insulation testing; maximum likelihood estimation; measurement errors; Weibull distributions estimation; Weibull shape parameter; bias; breakdown statistics; limited data sets; linear regression methods; maximum likelihood methods; parameter estimation; plotting position; random errors; revised IEEE guide; scatter; solid dielectrics; systematic errors; Dielectric breakdown; Electric breakdown; Linear regression; Maximum likelihood estimation; Parameter estimation; Scattering parameters; Shape; Statistical distributions; Testing; Weibull distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 1999 Annual Report Conference on
Conference_Location
Austin, TX
Print_ISBN
0-7803-5414-1
Type
conf
DOI
10.1109/CEIDP.1999.804618
Filename
804618
Link To Document