DocumentCode
3314657
Title
Piezoresistive effects in thick film resistors for strain sensing applications
Author
Kerns, D.V., Jr. ; Kang, W.P. ; Ali-Ali, A.R.
Author_Institution
Dept. of Electr. Eng., Vanderbilt Univ., Nashville, TN, USA
fYear
1989
fDate
9-12 Apr 1989
Firstpage
348
Abstract
Experimental investigations of piezoresistive effects in thick-film resistors were performed by measuring longitudinal and transverse gauge factors as a function of applied strain on two different substrates´ thickness. The relative change in resistance of the thick-film resistors studied was linear, symmetric, reproducible, and free of measurable hysteresis for strain between 0 and ±1000 microstrain. A gauge factor of approximately twice that previously reported was obtained. The suitability of this technology for strain-sensing applications is discussed
Keywords
electric sensing devices; piezoelectric transducers; strain measurement; thick film resistors; applied strain; longitudinal gauge factors; piezoresistive effects; strain sensing applications; thick film resistors; transverse gauge factors; Capacitive sensors; Electrical resistance measurement; Hysteresis; Performance evaluation; Piezoresistance; Resistors; Strain measurement; Substrates; Thick films; Thickness measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Southeastcon '89. Proceedings. Energy and Information Technologies in the Southeast., IEEE
Conference_Location
Columbia, SC
Type
conf
DOI
10.1109/SECON.1989.132392
Filename
132392
Link To Document