ESD Failures of Integrated Circuits and Their Diagnostics Using Transmission Line Pulsing

Author

Piatek, Z. ; Kolodziejski, J.F. ; Pleskacz, W.A.

Author_Institution

Warsaw Univ. of Technol., Warsaw

fYear

2007

fDate

11-13 April 2007

Firstpage

1

Lastpage

5

Abstract

In the work typical ESD failures of integrated circuits and ESD testing methods are presented. Authors describe dependencies between ESD models and different ESD failures. In order to allow more advanced ESD testing of integrated circuits, transmission line pulsing is proposed and its correlation to HBM method described. Finally conclusions based on up-to-date research and test results obtained with the help of the assembled TLP tester are provided.

Keywords

electrostatic discharge; fault diagnosis; integrated circuit reliability; integrated circuit testing; transmission line theory; electrostatic discharge failure diagnostic; electrostatic discharge testing methods; human body model method; integrated circuits; transmission line pulsing; Biological system modeling; Circuit testing; Distributed parameter circuits; Electrons; Electrostatic discharge; Integrated circuit interconnections; Integrated circuit technology; Predictive models; Protection; Semiconductor devices;

fLanguage

English

Publisher

ieee

Conference_Titel

Design and Diagnostics of Electronic Circuits and Systems, 2007. DDECS '07. IEEE

Conference_Location

Krakow

Print_ISBN

1-4244-1162-9

Electronic_ISBN

1-4244-1162-9

Type

conf

DOI

10.1109/DDECS.2007.4295323

Filename

4295323