DocumentCode
3315307
Title
Simulation of predischarge processes in SF6/N2 mixtures stressed by very fast transient voltages
Author
Pfeiffer, W. ; Schoen, D. ; Tong, L.Z.
Author_Institution
Darmstadt Univ. of Technol., Germany
fYear
1999
fDate
1999
Firstpage
391
Abstract
This paper deals with the numerical simulation of discharge processes in SF6/N2 mixtures. We introduce the particle-in-cell (PIC) method using a Monte Carlo collision module (MCC) applied to a two dimensional model of an inhomogeneous gap configuration. Calculation of the electrical field and the spatial distribution of electrons and ions in pure SF6 and in 10% SF 6/N2 gas mixtures for this configuration were carried out for an total time of 5 ns after applying the test voltage. Eight particle collision types including electron-ion impact and photoionisation have been considered
Keywords
Monte Carlo methods; SF6 insulation; discharges (electric); electron impact ionisation; gas mixtures; nitrogen; photoionisation; plasma simulation; sulphur compounds; Monte Carlo collision module; SF6-N2; SF6/N2 mixtures; discharge processes; electrical field; electron spatial distribution; electron-ion impact; inhomogeneous gap configuration; ion spatial distribution; numerical simulation; particle collision types; particle-in-cell method; photoionisation; predischarge processes; two dimensional model; very fast transient voltages; Electrons; Equations; Gas insulated transmission lines; Gas insulation; Ionization; Mesh generation; Numerical simulation; Particle collisions; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 1999 Annual Report Conference on
Conference_Location
Austin, TX
Print_ISBN
0-7803-5414-1
Type
conf
DOI
10.1109/CEIDP.1999.804670
Filename
804670
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