DocumentCode
3315311
Title
Using Cluster Analysis to Identify Coincidental Correctness in Fault Localization
Author
Li, Yihan ; Liu, Chao
Author_Institution
Sch. of Comput. Sci. & Eng., Beihang Univ., Beijing, China
fYear
2012
fDate
17-19 Aug. 2012
Firstpage
357
Lastpage
360
Abstract
In order to improve efficiency of debugging, many fault localization techniques have been proposed to find out the program entities that are likely to contain faults. However, recent researches indicate that the effectiveness of fault localization techniques suffers from occurrences of coincidental correctness, which means execution result of test cases that exercise faulty statements indicate no failure information. This paper presents a strategy using cluster analysis to identify coincidental correctness in test sets for fault localization. Test cases that exercise same faulty statements are expected to be grouped together by cluster analysis, and then during debugging these tests that are identified to contain coincidental correctness can be used to improve effectiveness of fault localization techniques. To evaluate our technique, we conducted an experiment on some Siemens Suit programs. The experimental results show that the strategy is effective at automatically identifying coincidental correct tests.
Keywords
automatic testing; fault diagnosis; pattern clustering; program debugging; software fault tolerance; Siemens Suit programs; automatic coincidental correct test identification; cluster analysis; debugging efficiency; fault localization techniques; faulty statements; Accuracy; Debugging; Educational institutions; Fault diagnosis; Schedules; Software; USA Councils; cluster analysis; coincidental correctness; fault localization;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational and Information Sciences (ICCIS), 2012 Fourth International Conference on
Conference_Location
Chongqing
Print_ISBN
978-1-4673-2406-9
Type
conf
DOI
10.1109/ICCIS.2012.361
Filename
6300510
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