SEU MITIGATION-using 1/3 rate convolution coding

With the new emerging fabrication technology there has been scaling of components size, leading to reduction in the physical size of devices. This increases the frequency of radiation induced temporary faults also called soft errors, which corrupts the content of the memory system. This paper proposes a new technique to protect the data from these soft errors which occurs in form of bit flips in the memory. The technique introduced is based on simple convolution codes and is proven to give good performance.