Title :
0.7 V supply self-biased nanoWatt MOS-only threshold voltage monitor
Author :
Mattia, Oscar E. ; Klimach, Hamilton ; Bampi, Sergio ; Schneider, Marcio
Author_Institution :
ETRO Dept., Vrije Univ. Brussel, Leuven, Belgium
Abstract :
This work presents a self-biased MOSFET threshold voltage VT0 monitor. The threshold condition is defined based on a current-voltage relationship derived from a continuous physical model. The model is valid for any operating condition, from weak to strong inversion, and under triode or saturation regimes. The circuit consists in balancing two self-cascode cells operating at different inversion levels, where one of the transistors that compose these cells is biased at the threshold condition. The circuit is MOSFET-only (can be implemented in any standard digital process), and it operates with a power supply of less than 1 V, consuming tenths of nW. We propose a process independent design methodology, evaluating different trade-offs of accuracy, area and power consumption. Schematic simulation results, including Monte Carlo variability analysis, support the VT0 monitoring behavior of the circuit with good accuracy on a 180 nm process.
Keywords :
MOSFET; Monte Carlo methods; monitoring; power consumption; semiconductor device models; MOSFET threshold voltage monitor; Monte Carlo variability analysis; design methodology; digital process; power consumption; saturation regimes; schematic simulation; self-biased nanoWatt MOS-only threshold voltage monitor; self-cascode cells; size 180 nm; triode; voltage 0.7 V; Integrated circuit modeling; MOSFET; Monitoring; Semiconductor device modeling; Temperature sensors; Threshold voltage;
Conference_Titel :
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location :
Lisbon
DOI :
10.1109/ISCAS.2015.7168679