DocumentCode :
3315615
Title :
Irregular sampling, active observability, and convergence rates of state observers for systems with binary-valued observations
Author :
Li, Chanying ; Wang, Le Yi ; Yin, G. George ; Guo, Yin Lei ; Xu, Cheng-Zhong
Author_Institution :
ECE Dept., Wayne State Univ., Detroit, MI, USA
fYear :
2009
fDate :
15-18 Dec. 2009
Firstpage :
8506
Lastpage :
8511
Abstract :
This paper is concerned with state observer design of systems with binary-valued output measurements. First, observability of sampled systems is obtained under noise-free observations and arbitrary sampling times. It demonstrates that if the original system is observable, the sampled system is always observable whenever sampling density is larger than some critical frequency, independent of the actual time sequences. This result is then used to design switching time sequences and deduce active observability for systems with binary-valued output observations. Convergence of state estimates relies on some persistent excitation conditions that are usually required to hold. When observations become noise corrupted it is shown that by designing suitable switching time sequences certain convergence rates can always be obtained, which are explicitly derived.
Keywords :
convergence; observability; observers; sampled data systems; sequences; active observability; binary valued observations; binary valued output measurements; binary-valued output observations; convergence rates; critical frequency; irregular sampling; persistent excitation conditions; sampled systems; sampling density; state estimates; state observer design; state observers; time sequences; Active noise reduction; Convergence; Eigenvalues and eigenfunctions; Frequency synchronization; MIMO; Mathematics; Observability; Sampling methods; Signal resolution; State estimation; Observability; binary-valued observation; sampled system;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Decision and Control, 2009 held jointly with the 2009 28th Chinese Control Conference. CDC/CCC 2009. Proceedings of the 48th IEEE Conference on
Conference_Location :
Shanghai
ISSN :
0191-2216
Print_ISBN :
978-1-4244-3871-6
Electronic_ISBN :
0191-2216
Type :
conf
DOI :
10.1109/CDC.2009.5400763
Filename :
5400763
Link To Document :
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