DocumentCode :
331572
Title :
Frequency and temperature dependence of the dielectric properties of ferroelectric materials
Author :
Dong, Ming ; Gerhardt, Rosario
Author_Institution :
Sch. of Mater. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
1
fYear :
1998
fDate :
25-28 Oct 1998
Firstpage :
327
Abstract :
A review is given of the dielectric properties of some ferroelectric single crystal and polycrystalline bulk ceramics (LiTaO 3 single crystal, sol-gel derived PbZr0.53Ti0.47O3 polycrystalline ceramic, SrBi2Nb2O9 polycrystalline ceramics) over a wide frequency and temperature range. The properties were investigated by ac impedance spectroscopy. The measured data have been presented with different formalisms for better understanding the dielectric properties. 3D-graphs were used to present simultaneously both the frequency and temperature dependency of the dielectric properties. The great strength of this kind of analysis technique is that it is possible to characterize the different electrically-active regions in a ferroelectric material
Keywords :
bismuth compounds; dielectric hysteresis; dielectric losses; electric impedance; ferroelectric ceramics; lead compounds; leakage currents; lithium compounds; permittivity; strontium compounds; 3D-graphs; LiTaO3; LiTaO3 single crystal; PZT; PbZr0.53Ti0.47O3; PbZrO3TiO3; SrBi2Nb2O9; SrBi2Nb2O9 polycrystalline ceramics; ac impedance spectroscopy; dielectric properties; electrically-active regions; ferroelectric materials; ferroelectric single crystal; frequency dependence; polycrystalline bulk ceramics; review; sol-gel derived PbZr0.53Ti0.47O3 polycrystalline ceramic; temperature dependence; Ceramics; Dielectric constant; Dielectric measurements; Electrochemical impedance spectroscopy; Ferroelectric materials; Frequency measurement; Grain boundaries; Impurities; Materials science and technology; Temperature dependence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1998. Annual Report. Conference on
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-5035-9
Type :
conf
DOI :
10.1109/CEIDP.1998.733998
Filename :
733998
Link To Document :
بازگشت