The Emission Gated Device Experiment

Author

Kodis, M.A. ; Vanderplaats, N.R. ; Zaidman, E.G.

Author_Institution

US Naval Res. Lab., Washington, DC, USA

fYear

1990

fDate

9-12 Dec. 1990

Firstpage

893

Lastpage

896

Abstract

The Emission Gated Device Experiment has been constructed to observe a prebunched electron beam in a traveling wave circuit. The objective of this study is to define the efficiency, bandwidth, and high-frequency performance of emission gated devices for potential applications in radar, electronic warfare, and neutral particle beam accelerators. With tight bunches injected into an undriven helix one wavelength long, an efficiency of 6% and a gain of 10 dB have been observed. Experimental results and simulations are compared with a view to understanding the dynamics of the bunched beam in the circuit fields. Tight bunching and high average current are shown to be the strongest contributors to high efficiency; therefore, a practical device requires a very high gain input circuit.<>

Keywords

digital simulation; electrodynamics; electron beams; electron-wave tubes; ultra-high-frequency tubes; 10 dB; 6 percent; Emission Gated Device Experiment; UHF; bandwidth; bunched beam dynamics; circuit fields; density modulated tubes; efficiency; high-frequency performance; prebunched electron beam; simulations; traveling wave circuit; undriven; Bandwidth; Circuit simulation; Electron accelerators; Electron beams; Electronic warfare; Gain; Particle accelerators; Particle beams; Radar applications;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices Meeting, 1990. IEDM '90. Technical Digest., International

Conference_Location

San Francisco, CA, USA

ISSN

0163-1918

Type

conf

DOI

10.1109/IEDM.1990.237019

Filename

237019