• DocumentCode
    3316087
  • Title

    Time series representation for anomaly detection

  • Author

    Leng, Mingwei ; Lai, Xinsheng ; Tan, Guolv ; Xu, Xiaohui

  • Author_Institution
    Dept. of Math. & Comput., Shangrao Normal Univ., Shangrao, China
  • fYear
    2009
  • fDate
    8-11 Aug. 2009
  • Firstpage
    628
  • Lastpage
    632
  • Abstract
    Anomaly detection in time series has attracted a lot of attention in the last decade, and is still a hot topic in time series mining. However, time series are high dimensional and feature correlational, directly detecting anomaly patterns in its raw format is very expensive, in addition, different time series may have different lengths of anomaly patterns, and usually, the lengths of anomaly patterns is unknown. This paper presents a new conception key point and an algorithm of seeking key points, the algorithm uses key points to re-represent time series and still preserves its fundamental characteristics. Variable length method was used to segment re-represented time series into patterns and calculate anomaly scores of patterns. Anomaly patterns are identified by their anomaly scores automatically. The effectiveness of representational algorithm and anomaly detecting algorithm are demonstrated with both synthetic and standard datasets, and the experimental results confirm that our methods can identify anomaly patterns with different lengths and improve the speed of detecting algorithm greatly.
  • Keywords
    data mining; time series; anomaly detection; anomaly score; conception key point; re-represented time series; time series mining; time series representation; variable length method; Computer vision; Discrete Fourier transforms; Electronic mail; Fourier transforms; Frequency domain analysis; Information analysis; Mathematics; Shape; Time measurement; anomaly patterns; key points; time series; time series representation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Information Technology, 2009. ICCSIT 2009. 2nd IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-4519-6
  • Electronic_ISBN
    978-1-4244-4520-2
  • Type

    conf

  • DOI
    10.1109/ICCSIT.2009.5234775
  • Filename
    5234775