DocumentCode
3316120
Title
Parametric regret in uncertain Markov decision processes
Author
Xu, Huan ; Mannor, Shie
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Texas as Austin, Austin, TX, USA
fYear
2009
fDate
15-18 Dec. 2009
Firstpage
3606
Lastpage
3613
Abstract
We consider decision making in a Markovian setup where the reward parameters are not known in advance. Our performance criterion is the gap between the performance of the best strategy that is chosen after the true parameter realization is revealed and the performance of the strategy that is chosen before the parameter realization is revealed. We call this gap the parametric regret. We consider two related problems: minimax regret and mean-variance tradeoff of the regret. The minimax regret strategy minimizes the worst-case regret under the most adversarial possible realization. We show that the problem of computing a minimax regret strategy is NP-hard and propose algorithms to efficiently finding it under favorable conditions. The mean-variance tradeoff formulation requires a probabilistic model of the uncertain parameters and looks for a strategy that minimizes a convex combination of the mean and the variance of the regret. We prove that computing such a strategy can be done numerically in an efficient way.
Keywords
Markov processes; computational complexity; decision making; minimax techniques; probability; Markovian setup; NP-hard problem; convex combination; decision making; mean-variance tradeoff formulation; minimax regret strategy; parameter realization; parametric regret; performance criterion; probabilistic model; uncertain Markov decision processes; uncertain parameters; worst-case regret; Bayesian methods; Contracts; Councils; Decision making; Electric variables measurement; Minimax techniques; Portfolios; Random variables; Stochastic processes; Uncertain systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control, 2009 held jointly with the 2009 28th Chinese Control Conference. CDC/CCC 2009. Proceedings of the 48th IEEE Conference on
Conference_Location
Shanghai
ISSN
0191-2216
Print_ISBN
978-1-4244-3871-6
Electronic_ISBN
0191-2216
Type
conf
DOI
10.1109/CDC.2009.5400796
Filename
5400796
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