• DocumentCode
    3316189
  • Title

    Flexible evaluation of RFID system parameters using rapid prototyping

  • Author

    Angerer, Christoph ; Langwieser, Robert

  • Author_Institution
    Inst. of Commun. & Radio-Freq. Eng., Vienna Univ. of Technol., Vienna
  • fYear
    2009
  • fDate
    27-28 April 2009
  • Firstpage
    42
  • Lastpage
    47
  • Abstract
    Today´s RFID systems are dependent on a wide range of different parameters, that influence the overall performance. Such system parameters can for example be the selected data rate, encoding scheme, modulation setting, transmit power or different hardware configurations, like one or two antenna scenarios. Furthermore, it is often desired to optimise several performance goals, like read-out range, read-out quality, throughput, etc., which are often contradicting each other. In order to achieve a desired performance of an RFID system, it is essential to understand the influences of the individual parameters of interest and their interconnection. Due to the multitude, wide range and interdependencies of influencing factors, this however is a complex task. Simulations offer insights in these relations but rely on the correct modeling of the dependencies of- and between the parameters. With our established prototyping system for RFID, we are able to flexibly and accurately explore the influence and interconnection of such parameters in a wide range on a basis of real-time measurements. Results on the evaluation of read-out quality depending on the transmit power and the data rate are presented.
  • Keywords
    radiofrequency identification; RFID system; encoding scheme; modulation setting scheme; parameter interconnection system; radiofrequency identification; real-time measurement; Encoding; Hardware; Pharmaceutical technology; Power system interconnection; Prototypes; Radiofrequency identification; Semiconductor device measurement; Throughput; Transponders; UHF measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    RFID, 2009 IEEE International Conference on
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    978-1-4244-3337-7
  • Electronic_ISBN
    978-1-4244-3338-4
  • Type

    conf

  • DOI
    10.1109/RFID.2009.4911188
  • Filename
    4911188