DocumentCode :
3316340
Title :
Simulated Annealing with Fuzzy Fitness Function for Test Frequencies Selection
Author :
Grzechca, Damian ; Golonek, Tomasz ; Rutkowski, Jerzy
Author_Institution :
Silesian Univ. of Technol., Gliwice
fYear :
2007
fDate :
23-26 July 2007
Firstpage :
1
Lastpage :
6
Abstract :
This paper discusses the optimization of input source frequencies to obtain the highest detection and location rate of a circuit under test. The minimum number of frequencies for distinguishes between fault and fault free elements are desired. We briefly describe the basic concepts of simulated annealing method and fuzzy evaluation (fitness) system. Presented application shows how to code the optimization problem. It has been compared algorithm with fuzzy goal function and weighted goal function. Obtained results are attached and discussed.
Keywords :
circuit testing; fault diagnosis; fuzzy set theory; logic testing; simulated annealing; circuit testing; fault free element; fuzzy evaluation system; fuzzy fitness function; input source frequency optimization; simulated annealing; test frequency selection; Circuit faults; Circuit simulation; Circuit testing; Current measurement; Electronic circuits; Fault diagnosis; Frequency; Fuzzy systems; Performance evaluation; Simulated annealing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Fuzzy Systems Conference, 2007. FUZZ-IEEE 2007. IEEE International
Conference_Location :
London
ISSN :
1098-7584
Print_ISBN :
1-4244-1209-9
Electronic_ISBN :
1098-7584
Type :
conf
DOI :
10.1109/FUZZY.2007.4295406
Filename :
4295406
Link To Document :
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