Title :
Fabrication of 64 M DRAM with i-line phase-shift lithography
Author :
Nakagawa, K. ; Taguchi, M. ; Ema, T.
Author_Institution :
Fujitsu Ltd., Kawasaki, Japan
Abstract :
New phase-shift lithography applicable to all device patterns has been developed which combines pattern formation with the shifter alone and edge contrast enhancement with the shifter. Using it one can make 0.3 mu m patterns with i-line photolithography. A 64 M DRAM having memory cells unrestricted by angular considerations was designed for use with this lithography, and experimental 64 M DRAM chips were fabricated. The technique eliminates the need for special pattern design such as assistant patterns. Since it requires only the original design pattern, it is easy to apply to fabrication.<>
Keywords :
CMOS integrated circuits; DRAM chips; integrated circuit technology; photolithography; 0.3 micron; 64 Mbit; CMOS; DRAM; edge contrast enhancement; i-line phase-shift lithography; i-line photolithography; memory cells; pattern formation; Fabrication; Lithography; Pattern formation; Random access memory;
Conference_Titel :
Electron Devices Meeting, 1990. IEDM '90. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/IEDM.1990.237037